School of Industrial Technology

Scanning Electron Microscope

Scanning Electron Microscope 

Instrument Status: OK 

Date Updated: 22 April 2022

Instrument Information

Brand and Model: Zeiss/EVO-MA10

Description: A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode.Specimens are observed in high vacuum in a conventional SEM, or in low vacuum or wet conditions in a variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.

Category: Physical Analysis

Location: Lab 047, School of Industrial Technology, USM

Lab Category: Centralised Lab

Person-in-Charge

Lab Personnel: En. Shamsul Zoolkifili (+604 653 2189 ⎪ zshamsul@usm.my)

Lecturer:

Rental Rate

PPTI Internal User (final year project undergraduate student): RM150/sample

PPTI Internal User (postgraduate student): RM150/sample

USM Internal User: RM150/sample

External User: RM300/sample

Disclaimer:
Rental rates may be changed at any time without further notice.
We reserve the right to change our rental's rates at any time without further notice.

  • Hits: 2417

PPTI Youtube Channel

Endowment

Our Location

School of Industrial Technology, Building G07, Persiaran Sains, Universiti Sains Malaysia 11800 Pulau Pinang, Malaysia.
Tel: +604 653 2219 | Fax: +604-653 6375 | Email: dean_ind@usm.my

  • Last Modified: Wednesday, 15 January 2025