Scanning Electron Microscope
Instrument Status: OK
Date Updated: 22 April 2022
Instrument Information
Brand and Model: Zeiss/EVO-MA10
Description: A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode.Specimens are observed in high vacuum in a conventional SEM, or in low vacuum or wet conditions in a variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.
Category: Physical Analysis
Location: Lab 047, School of Industrial Technology, USM
Lab Category: Centralised Lab
Person-in-Charge
Lab Personnel: En. Shamsul Zoolkifili (+604 653 2189 ⎪ zshamsul@usm.my)
Lecturer:
Rental Rate
PPTI Internal User (final year project undergraduate student): RM150/sample
PPTI Internal User (postgraduate student): RM150/sample
USM Internal User: RM150/sample
External User: RM300/sample
Disclaimer:
Rental rates may be changed at any time without further notice. We reserve the right to change our rental's rates at any time without further notice.
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