Atomic Force Microscope

Instrument Status: OK 

Date Updated: 22 April 2022

Instrument Information

Brand and Model: Park System XE-70

Description: Atomic force microscopy is a powerful microscopy technology for studying samples at the nanoscale. It is versatile because an atomic force microscope can image in three-dimensional topography, but it also provides various types of surface measurements to the needs of scientists and engineers. It generates atomic-resolution images with the angstrom-scale resolution height information with minimal sample preparation.

Category: Physical Analysis

Location: Lab 047, School of Industrial Technology, USM

Lab Category: Centralised Lab

Person-in-Charge

Lab Personnel: En. Mohd Syukri Baharudin (+604 653 4304 ⎪ mohdsyukri@usm.my)

Lecturer:

Rental Rate

PPTI Internal User (final year project undergraduate student): RM10/sample

PPTI Internal User (postgraduate student): RM50/sample

USM Internal User: RM120/sample

External User: RM170/sample

Disclaimer:
Rental rates may be changed at any time without further notice. We reserve the right to change our rental's rates at any time without further notice.